Overview
B. Hark Yoo is an econometrician affiliated with Rutgers University. His research focuses on Bayesian MCMC methods for regime-switching time-series models with GARCH-type errors.
Key Contributions / Features
- Co-developed (with Dhiman Das) a Bayesian MCMC algorithm for Markov Switching GARCH that handles the path-dependence problem via single-move state sampling; algorithm documented in Das-Yoo (2004).
- Author of a companion working paper, "A Bayesian Analysis of Markov Switching Models with ARMA-GARCH Errors" (Rutgers University, 2004), which extends the Das–Yoo approach to ARMA-GARCH error structures.
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