Delgado-Velasco (2005) Sign Tests for Long-Memory Time Series

long-memorysign-testnonparametricfractional-integrationrobust-inferenceinfinite-variance

Summary

Delgado and Velasco (2005) develop sign-based tests for the long-memory parameter dd of ARFIMA(p,d,q) (autoregressive fractionally integrated moving average) processes. The tests use only the signs of (pre-whitened) residuals, making them exact (finite-sample distribution-free) for simple hypotheses and locally most powerful (LMP) among sign tests. The key appeal is robustness to fat-tailed and infinite-variance innovations — precisely the cases where standard tests (Dickey-Fuller, Tanaka score test) collapse.

Key Claims

Concepts Introduced or Extended

Entities Mentioned

Quotes

"This methodology is especially appealing when applied to time series exhibiting infinite variance, which are likely in many fields, such as finance, economics, telecommunications and hydrology."

"Tanaka's test performs very poorly in the presence of errors with fat distribution tails."

My Take

The exactness result is elegant: because St(d0)=sign(εt(d0))S_t(d_0) = \text{sign}(\varepsilon_t(d_0)) are i.i.d. Rademacher under H0H_0 for any symmetric continuous innovation distribution, the test requires only the median-zero assumption. The practical caveat is that the asymptotic normal approximation is useless for economically relevant sample sizes — the paper itself shows severe under-rejection even at n=2000n=2000. The test is most useful as a robustness check when there is concern about fat-tailed or heavy-tailed innovations.